The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

Jul. 22, 2021
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Ke Zhang, Shanghai, CN;

Liang Li, Shanghai, CN;

Jiahui Yuan, Fremont, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/34 (2006.01); G11C 16/08 (2006.01); G11C 16/26 (2006.01); G11C 16/10 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3445 (2013.01); G11C 16/08 (2013.01); G11C 16/102 (2013.01); G11C 16/26 (2013.01); G11C 16/3459 (2013.01);
Abstract

Apparatuses and techniques are described for detecting and isolating defective blocks of memory cells in a multi-plane operation such as program or erase. In one aspect, a program operation begins in a multi-plane mode, for one block in each plane. If fewer than all blocks complete programming by the time a trigger number of program loops have been performed, one or more unpassed blocks are programmed further, one at a time, in a single plane mode. If the one or more unpassed blocks do not complete programming when a maximum allowable number of program loops have been performed, they are marked as bad blocks and disabled from further operations. In another aspect, when a trigger number of program loops have been performed, one or more unpassed blocks are subject to a word line leakage detection operation.


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