The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2023

Filed:

May. 10, 2021
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Li-Yen Lin, Wujie Township, Yilan County, TW;

Ching-Yu Chang, Yuansun Village, TW;

Chin-Hsiang Lin, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G03F 7/16 (2006.01); H01L 21/311 (2006.01); H01L 21/033 (2006.01); G03F 7/09 (2006.01); G03F 7/039 (2006.01); H01L 21/027 (2006.01); G03F 7/004 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70025 (2013.01); G03F 7/0045 (2013.01); G03F 7/0397 (2013.01); G03F 7/094 (2013.01); G03F 7/168 (2013.01); G03F 7/70033 (2013.01); H01L 21/0273 (2013.01); H01L 21/0332 (2013.01); H01L 21/31105 (2013.01); H01L 21/31144 (2013.01);
Abstract

A method for forming a semiconductor device structure is provided. The method includes forming a material layer over a substrate and forming a resist layer over the material layer. The method includes exposing a portion of the resist layer. The resist layer includes a photoacid generator (PAG) group, a quencher group, an acid-labile group (ALG) and a polar unit (PU). The method also includes performing a baking process on the resist layer and developing the resist layer to form a patterned resist layer. The method further includes doping a portion of the material layer by using the patterned resist layer as a mask to form a doped region. In addition, the method includes removing the patterned resist layer.


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