The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2023
Filed:
May. 15, 2019
Dalian University of Technology, Dalian, CN;
Wei Liu, Liaoning, CN;
Bing Liang, Liaoning, CN;
Mengde Zhou, Liaoning, CN;
Kun Liu, Liaoning, CN;
Yang Zhang, Liaoning, CN;
Di Feng, Liaoning, CN;
Xintong Jiang, Liaoning, CN;
Likun Si, Liaoning, CN;
Zhenyuan Jia, Liaoning, CN;
DALIAN UNIVERSITY OF TECHNOLOGY, Liaoning, CN;
Abstract
A 3D measurement model and the spatial calibration method based on a 1D displacement sensor are proposed. A 3D measurement system based on a fixed 1D displacement sensor is established; then a spatial measurement model based on the 1D displacement sensor is established; and then based on the high precision pose data of the measurement plane and sensor measurement data, spatial calibration constraint equation are established; a weighted iterative algorithms is employed to calculate the extrinsic parameters of the 1D sensor that meet the precision requirements, then the calibration process is completed. A high precision 3D measurement model is established; a 3D measurement model based on a 1D displacement sensor is established, and the calibration method of the measurement model is proposed, which will improve the precision of the 3D measurement model and solve the problem of inaccurate spatial measurement caused by the errors of the sensor extrinsic parameters.