The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Jun. 26, 2020
Applicant:

Carl Zeiss Smt Gmbh, Oberkochen, DE;

Inventor:

Mario Laengle, Jena, DE;

Assignee:

Carl Zeiss SMT GmbH, Oberkochen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); H04N 23/67 (2023.01); G02B 7/28 (2021.01); G06T 7/60 (2017.01);
U.S. Cl.
CPC ...
H04N 23/67 (2023.01); G02B 7/28 (2013.01); G06T 7/0004 (2013.01); G06T 7/60 (2013.01); G06T 2207/10148 (2013.01); G06T 2207/30148 (2013.01);
Abstract

The invention relates to a device for measuring a mask for microlithography, the device including an imaging device and an autofocusing device. The imaging device comprises an imaging optical unit with a focal plane for imaging the mask, an object stage for mounting the mask, and a movement module for producing a relative movement between object stage and imaging optical unit. The autofocusing device is configured to generate a focusing image by way of the imaging of a focusing structure in a focusing image plane intersecting the focal plane, in which the focusing structure is embodied as a gap. Furthermore, the invention relates to an autofocusing method for a device for measuring a mask for microlithography.


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