The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 09, 2023
Filed:
Jun. 15, 2021
Micron Technology, Inc., Boise, ID (US);
Markus H. Geiger, Boise, ID (US);
Matthew A. Prather, Boise, ID (US);
Sujeet Ayyapureddi, Boise, ID (US);
C. Omar Benitez, Boise, ID (US);
Dennis Montierth, Boise, ID (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
Apparatuses, systems, and methods for multi-bit error detection. A memory device may store data bits and parity bits in a memory array. An error correction code (ECC) circuit may generate syndrome bits based on the data and parity bits and use the syndrome bits to correct up to a single bit error in the data and parity bits. A multi-bit error (MBE) detection circuit may detect an MBE in the data and parity based on at least one of the syndrome bits or the parity bits. For example, the MBE detection circuit may determine if the syndrome bits have a mapped or unmapped state and/or may compare the parity bits, data bits, and an additional parity bit to determine if there is an MBE. When an MBE is detected an MBE signal is activated. In some embodiments, an MBE flag may be set based on the MBE signal being active.