The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

Aug. 03, 2021
Applicant:

Sandisk Technologies Llc, Addison, TX (US);

Inventors:

Xiang Yang, Santa Clara, CA (US);

Peter Rabkin, Cupertino, CA (US);

Henry Chin, Fremont, CA (US);

Ken Oowada, Fujisawa, JP;

Dengtao Zhao, Santa Clara, CA (US);

Gerrit Jan Hemink, San Ramon, CA (US);

Assignee:

SanDisk Technologies LLC, Addison, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 16/10 (2006.01); G11C 16/34 (2006.01); G11C 11/56 (2006.01); H01L 27/11565 (2017.01); H01L 25/065 (2023.01); H01L 27/11582 (2017.01);
U.S. Cl.
CPC ...
G11C 16/10 (2013.01); G11C 11/5671 (2013.01); G11C 16/0483 (2013.01); G11C 16/349 (2013.01); H01L 25/0657 (2013.01); H01L 27/11565 (2013.01); H01L 27/11582 (2013.01); H01L 2225/06562 (2013.01);
Abstract

Technology is provided for extending the useful life of a block of memory cells by changing an operating parameter in a physical region of the block that is more susceptible to wear than other regions. Changing the operating parameter in the physical region extends the life of that region, which extends the life of the block. The operating parameter may be, for example, a program voltage step size or a storage capacity of the memory cells. For example, using a smaller program voltage step size in a sub-block that is more susceptible to wear extends the life of that sub-block, which extends the life of the block. For example, programming memory cells to fewer bits per cell in the region of the block (e.g., sub-block, word line) that is more susceptible to wear extends the useful life of that region, which extends the life of the block.


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