The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 09, 2023

Filed:

May. 19, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Ning Chen, San Jose, CA (US);

Juane Li, Milpitas, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1004 (2013.01); G06F 3/0619 (2013.01); G06F 3/0653 (2013.01); G06F 3/0673 (2013.01); G06F 11/1096 (2013.01);
Abstract

First data is received. First error-checking data generated based on a cyclic redundancy check (CRC) operation of the first data is received. Second data is generated by combining the first data with a first data pattern. Second error-checking data of the second data is generated by using a combination of the first error-checking data and a second data pattern. The second data pattern has a size that is based on the first data pattern.


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