The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2023

Filed:

Apr. 06, 2021
Applicant:

United Microelectronics Corp., Hsin-Chu, TW;

Inventors:

Kun-Ju Li, Tainan, TW;

Tai-Cheng Hou, Tainan, TW;

Hsin-Jung Liu, Pingtung County, TW;

Fu-Yu Tsai, Tainan, TW;

Bin-Siang Tsai, Changhua County, TW;

Chau-Chung Hou, Tainan, TW;

Yu-Lung Shih, Tainan, TW;

Ang Chan, Taipei, TW;

Chih-Yueh Li, Taipei, TW;

Chun-Tsen Lu, Tainan, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/82 (2006.01); H01L 27/22 (2006.01); H01L 43/12 (2006.01); H01F 41/34 (2006.01); G11C 11/16 (2006.01); H01F 10/32 (2006.01); H01L 43/02 (2006.01);
U.S. Cl.
CPC ...
H01L 27/222 (2013.01); G11C 11/161 (2013.01); H01F 10/3254 (2013.01); H01F 41/34 (2013.01); H01L 43/02 (2013.01); H01L 43/12 (2013.01);
Abstract

A method for fabricating semiconductor device includes the steps of: forming a first magnetic tunneling junction (MTJ) and a second MTJ on a substrate; forming a first top electrode on the first MTJ and a second top electrode on the second MTJ; forming a first ultra low-k (ULK) dielectric layer on the first MTJ and the second MTJ; forming a passivation layer on the first ULK dielectric layer, wherein a bottom surface of the passivation layer between the first MTJ and the second MTJ is lower than a top surface of the first MTJ; and forming a second ULK dielectric layer on the passivation layer.


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