The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 04, 2023

Filed:

Jun. 23, 2020
Applicant:

Screen Holdings Co., Ltd., Kyoto, JP;

Inventors:

Noritake Sumi, Kyoto, JP;

Masanobu Sato, Kyoto, JP;

Masayuki Orisaka, Kyoto, JP;

Daiki Uehara, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); B08B 5/00 (2006.01); B08B 3/08 (2006.01); B08B 7/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/6704 (2013.01); B08B 3/08 (2013.01); B08B 5/00 (2013.01); B08B 7/0021 (2013.01); H01L 21/67017 (2013.01);
Abstract

The disclosure provides a substrate processing apparatus that processes a surface of a substrate with a processing fluid in a supercritical state, in which the substrate is protected from the pressure fluctuation caused by partial vaporization of the processing fluid in the flow path. A substrate processing apparatus which processes a surface of a substrate with a processing fluid in a supercritical state includes a chamber housing provided therein with a processing space capable of housing the substrate and a flow path which receives the processing fluid from outside and guides the processing fluid to the processing space, and a fluid supply part which pressure-feeds the processing fluid to the flow path, wherein a plurality of bent parts which change a flow direction of the processing fluid are provided in the flow path.


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