The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 21, 2023

Filed:

Dec. 04, 2020
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Saeed Sharifi Tehrani, San Diego, CA (US);

Sivagnanam Parthasarathy, Carlsbad, CA (US);

Aniryudh Reddy Durgam, San Diego, CA (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 12/0877 (2016.01); G06F 11/07 (2006.01); G06F 12/126 (2016.01);
U.S. Cl.
CPC ...
G06F 12/0877 (2013.01); G06F 11/0727 (2013.01); G06F 12/126 (2013.01); G06F 2212/60 (2013.01);
Abstract

Exemplary methods, apparatuses, and systems include receiving a read operation directed to an aggressor location. An integrity scan of a victim location of the aggressor location is performed to determine an error value for the victim location. Data from the aggressor location is copied to a cache in response to determining the error value for the victim location satisfies a first error value threshold. The cache is a different type of memory from the aggressor location.


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