The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 21, 2023

Filed:

Mar. 09, 2022
Applicant:

Globalwafers Co., Ltd., Hsinchu, TW;

Inventors:

Jia-Zhe Liu, Hsinchu, TW;

Yen-Lun Huang, Hsinchu, TW;

Ying-Ru Shih, Hsinchu, TW;

Assignee:

GlobalWafers Co., Ltd., Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/20 (2006.01); H01L 29/205 (2006.01); H01L 33/22 (2010.01); H01L 29/06 (2006.01); H01L 21/02 (2006.01); C30B 25/20 (2006.01);
U.S. Cl.
CPC ...
H01L 29/0607 (2013.01); H01L 29/2003 (2013.01); H01L 29/205 (2013.01); H01L 33/22 (2013.01); C30B 25/20 (2013.01); H01L 21/0254 (2013.01); H01L 21/02458 (2013.01);
Abstract

An epitaxial structure includes a substrate, a nucleation layer on the substrate, a buffer layer on the nucleation layer, and a nitride layer on the buffer layer. The nucleation layer consists of regions in a thickness direction, wherein a chemical composition of the regions is AlInN, where 0≤x≤1. A maximum value of the x value in the plurality of regions is the same, a minimum value of the x value in the plurality of regions is the same, and an absolute value of a gradient slope of each of the regions is 0.1%/nm to 50%/nm. A thickness of the nucleation layer is less than a thickness of the buffer layer. A roughness of a surface of the nucleation layer in contact with the buffer layer is greater than a roughness of a surface of the buffer layer in contact with the nitride layer.


Find Patent Forward Citations

Loading…