The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 14, 2023
Filed:
Aug. 27, 2019
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Diana C. Majerus, Boise, ID (US);
Scott D. Van De Graaff, Boise, ID (US);
Todd J. Plum, Boise, ID (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/44 (2013.01); G11C 8/10 (2006.01); G11C 8/20 (2006.01); G11C 5/14 (2006.01);
U.S. Cl.
CPC ...
G06F 21/44 (2013.01); G11C 5/147 (2013.01); G11C 8/10 (2013.01); G11C 8/20 (2013.01); G06F 2221/2101 (2013.01);
Abstract
Apparatuses and methods related to logging failed authentication attempts. Failed authentication attempts can be logged in the circuitry by degrading the circuitry. The degradation can signal a fail authentication attempt while an amount of the degradation can represent a timing of the error.
Majerus, Diana. (2023). Authentication logging using circuitry degradation (U.S. Patent No. 11580214). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11580214
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile