The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 2023

Filed:

Jan. 04, 2022
Applicant:

Unimicron Technology Corp., Taoyuan, TW;

Inventors:

Hsin-Hung Lee, Taoyuan, TW;

Chun-Hsien Chien, New Taipei, TW;

Yu-Chung Hsieh, Taoyuan, TW;

Yi-Hsiu Fang, Taoyuan, TW;

Tzyy-Jang Tseng, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0878 (2013.01); G01R 29/0871 (2013.01);
Abstract

An inspection apparatus used for inspecting a bare circuit board is provided, where the bare circuit board includes an antenna. The inspection apparatus includes a holding stage, a probing device, and a measurement device. The holding stage can hold the bare circuit board. The measurement device is electrically connected to the probing device and electrically connected to the antenna via the probing device. The measurement device can input a first testing signal to the antenna. The antenna can input a second testing signal to the measurement device after receiving the first testing signal. The measurement device can measure the antenna according to the second testing signal, where the first testing signal and the second testing signal both pass through no active component.


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