The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2023

Filed:

Dec. 14, 2020
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Mei-Yee Shek, Palo Alto, CA (US);

Bhargav S. Citla, Fremont, CA (US);

Joshua Rubnitz, Monte Sereno, CA (US);

Jethro Tannos, San Jose, CA (US);

Chentsau Chris Ying, Cupertino, CA (US);

Srinivas D. Nemani, Sunnyvale, CA (US);

Ellie Y. Yieh, San Jose, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/36 (2006.01); C01B 21/082 (2006.01); C23C 16/44 (2006.01); C23C 16/50 (2006.01); C09D 1/00 (2006.01);
U.S. Cl.
CPC ...
C23C 16/36 (2013.01); C01B 21/0828 (2013.01); C09D 1/00 (2013.01); C23C 16/4408 (2013.01); C23C 16/50 (2013.01);
Abstract

Methods for plasma enhanced chemical vapor deposition (PECVD) of silicon carbonitride films are described. A flowable silicon carbonitride film is formed on a substrate surface by exposing the substrate surface to a precursor and a reactant, the precursor having a structure of general formula (I) or general formula (II) wherein R, R, R, R, R, R, R, R, R, R, R, and Rare independently selected from hydrogen (H), substituted or unsubstituted alkyl, substituted or unsubstituted alkoxy, substituted or unsubstituted vinyl, silane, substituted or unsubstituted amine, or halide; purging the processing chamber of the silicon precursor, and then exposing the substrate to an ammonia plasma.


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