The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2022

Filed:

Jan. 09, 2020
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Mark J. Saly, Santa Clara, CA (US);

Keenan Navarre Woods, San Ramon, CA (US);

Joseph R. Johnson, Redwood City, CA (US);

Bhaskar Jyoti Bhuyan, San Jose, CA (US);

William J. Durand, Oakland, CA (US);

Michael Chudzik, Mountain View, CA (US);

Raghav Sreenivasan, Fremont, CA (US);

Roger Quon, Rhinebeck, NY (US);

Assignee:

APPLIED MATERIALS, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B82Y 15/00 (2011.01); B82Y 40/00 (2011.01); G01N 33/487 (2006.01); B01D 67/00 (2006.01); C12Q 1/6869 (2018.01);
U.S. Cl.
CPC ...
G01N 33/48721 (2013.01); B82Y 40/00 (2013.01); C12Q 1/6869 (2013.01); B82Y 15/00 (2013.01);
Abstract

Embodiments of the present disclosure provide dual pore sensors and methods for producing these dual pore sensors. The method includes forming a film stack, where the film stack contains two silicon layers and two membrane layers, and then etching the film stack to produce a channel extending therethrough and having two reservoirs and two nanopores. The method also includes depositing a oxide layer on inner surfaces of the reservoirs and nanopores, depositing a dielectric layer on the oxide layer, and forming a metal contact extending through a portion of the stack. The method further includes etching the dielectric layers to form wells, etching the first silicon layer to reveal the protective oxide layer deposited on the inner surfaces of a reservoir, and etching the protective oxide layer deposited on the inner surfaces of the reservoirs and the nanopores.


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