The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Feb. 19, 2021
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Dian-Sheg Yu, Hsinchu, TW;

Ren-Fen Tsui, Taipei, TW;

Jhon Jhy Liaw, Zhudong Township, TW;

Ying-Jhe Fu, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/00 (2006.01); H01L 23/528 (2006.01); H01L 27/11 (2006.01); H01L 23/522 (2006.01); H01L 21/768 (2006.01); G11C 11/418 (2006.01); G11C 11/412 (2006.01);
U.S. Cl.
CPC ...
H01L 23/528 (2013.01); G11C 11/412 (2013.01); G11C 11/418 (2013.01); H01L 21/7684 (2013.01); H01L 21/76816 (2013.01); H01L 21/76877 (2013.01); H01L 23/5226 (2013.01); H01L 27/1104 (2013.01); H01L 27/1116 (2013.01);
Abstract

In some embodiments of the method, patterning the opening includes: projecting a radiation beam toward the second dielectric layer, the radiation beam having a pattern of the opening. In some embodiments of the method, the single-patterning photolithography process is an extreme ultraviolet (EUV) lithography process. In some embodiments of the method, filling the opening with the conductive material includes: plating the conductive material in the opening; and planarizing the conductive material and the second dielectric layer to form the first metal line from remaining portions of the conductive material, top surfaces of the first metal line and the second dielectric layer being planar after the planarizing.


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