The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2022

Filed:

Sep. 10, 2020
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

Gung-Pei Chang, Taipei, TW;

Yao-Wen Chang, Taipei, TW;

Hai-Dang Trinh, Hsinchu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/48 (2006.01); H01L 23/52 (2006.01); H01L 21/768 (2006.01); H01L 21/285 (2006.01); H01L 21/02 (2006.01); H01L 21/311 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76847 (2013.01); H01L 21/0228 (2013.01); H01L 21/02118 (2013.01); H01L 21/02178 (2013.01); H01L 21/02274 (2013.01); H01L 21/28556 (2013.01); H01L 21/28568 (2013.01); H01L 21/31116 (2013.01); H01L 21/76802 (2013.01); H01L 21/76831 (2013.01); H01L 24/05 (2013.01); H01L 24/13 (2013.01); H01L 24/83 (2013.01); H01L 2224/0401 (2013.01); H01L 2224/13155 (2013.01); H01L 2224/13644 (2013.01); H01L 2224/8385 (2013.01); H01L 2224/83805 (2013.01);
Abstract

A method for forming a semiconductor structure includes following operations. A first substrate including a first side, a second side opposite to the first side, and a metallic pad disposed over the first side is received. A dielectric structure including a first trench directly above the metallic pad is formed. A second trench is formed in the dielectric structure and a portion of the first substrate. A sacrificial layer is formed to fill the first trench and the second trench. A third trench is formed directly above the metallic pad. A barrier ring and a bonding structure are formed in the third trench. A bonding layer is disposed to bond the first substrate to a second substrate. A portion of the second side of the first substrate is removed to expose the sacrificial layer. The sacrificial layer is removed by an etchant.


Find Patent Forward Citations

Chang, Gung-Pei. (2022). Method for forming semiconductor structure (U.S. Patent No. 11532511). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11532511

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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