The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2022
Filed:
Nov. 20, 2020
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Wei Wang, Dublin, CA (US);
Jiangli Zhu, San Jose, CA (US);
Ying Yu Tai, Mountain View, CA (US);
Ning Chen, San Jose, CA (US);
Zhengang Chen, San Jose, CA (US);
Cheng Yuan Wu, Fremont, CA (US);
Assignee:
MICRON TECHNOLOGY, INC., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G11C 29/52 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 11/0727 (2013.01); G06F 11/0751 (2013.01); G06F 11/1068 (2013.01); G11C 29/52 (2013.01);
Abstract
A read operation to retrieve data stored at a memory device is performed. Whether the data retrieved from the memory device includes an error that is not correctable is determined. Responsive to determining that the data retrieved from the memory device comprises the error that is not correctable, a buffer in a data path along which a write operation was performed to write the data at the memory device is searched for the data.