The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2022
Filed:
Jul. 21, 2020
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Murong Lang, San Jose, CA (US);
Tingjun Xie, Milpitas, CA (US);
Wei Wang, Dublin, CA (US);
Frederick Adi, Castro Valley, CA (US);
Zhenming Zhou, San Jose, CA (US);
Jiangli Zhu, San Jose, CA (US);
Assignee:
MICRON TECHNOLOGY, INC., Boise, ID (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0655 (2013.01); G06F 3/0604 (2013.01); G06F 3/0679 (2013.01);
Abstract
A first operating characteristic and a second operating characteristic of a memory sub-system are determined. A write-to-read delay time is set in view of the first operating characteristic and the second operating characteristic. A read operation associated with a memory unit is executed following a period of at least the write-to-read delay time from a time of an execution of a write operation associated with the memory unit.