The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2022
Filed:
May. 13, 2022
Applicant:
Peking University, Beijing, CN;
Inventors:
Xia An, Beijing, CN;
Zhexuan Ren, Beijing, CN;
Gensong Li, Beijing, CN;
Xing Zhang, Beijing, CN;
Ru Huang, Beijing, CN;
Assignee:
Peking University, Beijing, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 30/367 (2020.01); G06F 119/02 (2020.01);
U.S. Cl.
CPC ...
G01R 31/2881 (2013.01); G06F 30/367 (2020.01); G06F 2119/02 (2020.01);
Abstract
A method for characterizing a fluctuation induced by single particle irradiation in a device. A plurality of devices varying in size are tested respectively before and after irradiation to obtain threshold voltage distribution, such that a threshold voltage fluctuation induced by irradiation is obtained and used to correct a process fluctuation model, so as to correct a design margin of the devices working under the irradiation.