The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2022

Filed:

Aug. 06, 2021
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Chi-Hung Liao, Taipei County, TW;

Wei Chang Cheng, Taichung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/956 (2006.01); H01L 21/027 (2006.01); H01L 21/67 (2006.01); H01L 21/68 (2006.01); G03F 7/16 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01N 21/95607 (2013.01); G01N 21/9501 (2013.01); G03F 7/162 (2013.01); G03F 7/168 (2013.01); H01L 21/0276 (2013.01); H01L 21/6715 (2013.01); H01L 21/67259 (2013.01); H01L 21/681 (2013.01);
Abstract

A photolithography method includes dispensing a first liquid onto a first target layer formed over a first wafer through a nozzle at a first distance from the first target layer; capturing an image of the first liquid on the first target layer; patterning the first target layer after capturing the image of the first liquid; comparing the captured image of the first liquid to a first reference image to generate a first comparison result; responsive to the first comparison result, positioning the nozzle and a second wafer such that the nozzle is at a second distance from a second target layer on the second wafer; dispensing a second liquid onto the second target layer formed over the second wafer through the nozzle at the second distance from the second target layer; and patterning the second target layer after dispensing the second liquid.


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