The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Oct. 07, 2020
Applicant:

Flex Ltd., Singapore, SG;

Inventors:

Weifeng Liu, Dublin, CA (US);

Jesus A. Tan, Fremont, CA (US);

William L. Uy, San Jose, CA (US);

Dongkai Shangguan, San Jose, CA (US);

Assignee:

Flex Ltd., Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/20 (2006.01); G01N 3/02 (2006.01);
U.S. Cl.
CPC ...
G01N 3/20 (2013.01); G01N 3/02 (2013.01); G01N 2203/0023 (2013.01); G01N 2203/0037 (2013.01); G01N 2203/0058 (2013.01); G01N 2203/0222 (2013.01);
Abstract

Methods, devices, and systems for testing the flexibility of a sample such as an electronic device are provided herein. A testing system can have a motor operably connected to a mandrel such that the motor causes the mandrel to accurately and precisely rotate and cause the sample to conform to an outer surface of the mandrel. Moreover, a proximal end of the sample is secured to the outer surface of the mandrel, and the opposing distal end is controlled by a retractable holder such that the entire sample is subjected to a constant bend radius as the mandrel rotates. Other aspects and features such as controlling the environment around the mandrel and securing small samples to the mandrel are also described herein.


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