The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2022

Filed:

Nov. 09, 2020
Applicant:

Ta Liang Technology Co., Ltd., Taoyuan, TW;

Inventors:

Hsien-Ming Lee, Taoyuan, TW;

Chun-Chen Chen, Taoyuan, TW;

Ching-Tang Hsueh, Taoyuan, TW;

Po-Ching Huang, Taoyuan, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24B 49/08 (2006.01); B24B 53/017 (2012.01);
U.S. Cl.
CPC ...
B24B 49/08 (2013.01); B24B 53/017 (2013.01);
Abstract

Disclosed are a detection method and a detection apparatus for a polishing pad of a chemical mechanical polishing device, particularly a detection method and a detection apparatus for detecting a surface of a polishing pad dynamically. An isolation region isolated by a gas to expose the polishing pad is formed by the detecting device, and a detection is performed on the isolation region, such that the chemical mechanical polishing device is capable of detecting the polishing pad without interrupting a manufacturing process and the detection results with more accurate can be achieved. Thereby, the polishing pad can be repaired and replaced more timely.


Find Patent Forward Citations

Loading…