The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2022

Filed:

Oct. 11, 2017
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Takashi Nakamitsu, Koshi, JP;

Shuhei Matsumoto, Koshi, JP;

Yosuke Omori, Koshi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/68 (2006.01); H01L 23/00 (2006.01); H01L 21/67 (2006.01); H01L 21/683 (2006.01); H01L 21/20 (2006.01); B23K 20/00 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 24/78 (2013.01); B23K 20/00 (2013.01); H01L 21/02 (2013.01); H01L 21/2007 (2013.01); H01L 21/67092 (2013.01); H01L 21/67259 (2013.01); H01L 21/67265 (2013.01); H01L 21/68 (2013.01); H01L 21/681 (2013.01); H01L 21/6838 (2013.01); H01L 24/85 (2013.01);
Abstract

A bonding apparatus configured to bond substrates comprises a first holder configured to vacuum-exhaust a first substrate to attract and hold the first substrate on a bottom surface thereof; a second holder disposed under the first holder, and configured to vacuum-exhaust a second substrate to attract and hold the second substrate on a top surface thereof; a mover configured to move the first holder and the second holder relatively in a horizontal direction; a laser interferometer system configured to measure a position of the first holder or the second holder which is moved by the mover; a linear scale configured to measure a position of the mover; and a controller configured to control the mover based on a measurement result of the laser interferometer system and a measurement result of the liner scale.


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