The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2022

Filed:

Apr. 15, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Saeed Sharifi Tehrani, San Diego, CA (US);

Ashutosh Malshe, Fremont, CA (US);

Kishore Kumar Muchherla, Fremont, CA (US);

Sivagnanam Parthasarathy, Carlsbad, CA (US);

Vamsi Pavan Rayaprolu, San Jose, CA (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0655 (2013.01); G06F 3/0604 (2013.01); G06F 3/0679 (2013.01);
Abstract

Exemplary methods, apparatuses, and systems include receiving a plurality of read operations directed to a portion of memory accessed by a memory channel. The plurality of read operations are divided into a current set of a sequence of read operations and one or more other sets of sequences of read operations. An aggressor read operation is selected from the current set. A supplemental memory location is selected independently of aggressors and victims in the current set of read operations. A first data integrity scan is performed on a victim of the aggressor read operation and a second data integrity scan is performed on the supplemental memory location.


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