The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Aug. 22, 2019
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Qisong Lin, El Dorado Hills, CA (US);

Vamsi Pavan Rayaprolu, San Jose, CA (US);

Jiangang Wu, Milpitas, CA (US);

Sampath K. Ratnam, Boise, ID (US);

Sivagnanam Parthasarathy, Carlsbad, CA (US);

Shao Chun Shi, Shanghai, CN;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0772 (2013.01); G06F 11/073 (2013.01); G06F 11/0751 (2013.01);
Abstract

A system includes a memory component to, upon completion of second pass programming in response to a multi-pass programming command, write flag bits within a group of memory cells programmed by the multi-pass programming command A processing device, operatively coupled to the memory component, is to perform multi-pass programming of the group of memory cells in association with a logical address. Upon receipt of a read request, the processing device is to determine that a second logical address within the read request does not match the logical address associated with data stored at a physical address of the group of memory cells. The processing device is further to determine a number of first values within the plurality of flag bits, and in response to the number of first values not satisfying a threshold criterion, report, to a host computing device, an uncorrectable data error.


Find Patent Forward Citations

Lin, Qisong. (2022). Granular error reporting on multi-pass programming of non-volatile memory (U.S. Patent No. 11461158). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11461158

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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