The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

May. 13, 2020
Applicant:

Asm Technology Singapore Pte Ltd, Singapore, SG;

Inventors:

Po Lam Au, Hong Kong, HK;

Liancheng Yang, Hong Kong, HK;

Chun Ting Tang, Hong Kong, HK;

Fan Leuk Lai, Hong Kong, HK;

Chi Piu Wong, Hong Kong, HK;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29D 11/00 (2006.01); G01M 11/02 (2006.01); G01B 11/26 (2006.01); G02B 27/62 (2006.01); B25J 15/00 (2006.01);
U.S. Cl.
CPC ...
G02B 27/62 (2013.01); B25J 15/00 (2013.01); B29D 11/00009 (2013.01); G01M 11/0264 (2013.01); G01B 11/26 (2013.01);
Abstract

A lens assembly is separated into a first lens module including at least one lens element and a second lens module including at least one other lens element during alignment of its lens elements. Coarse alignment is conducted by aligning an optical axis of at least one lens element within the first lens module with an optical axis of at least one lens element within the second lens module. For conducting fine alignment, an image sensor views a test chart while the first and second lens modules are positioned between the test chart and the image sensor. Image quality indices are obtained from the image sensor of the test chart at different relative alignments between the first and second lens modules, before the first lens module is fixed to the second lens module at a relative alignment therebetween where the image quality indices are optimized.


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