The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2022

Filed:

Mar. 30, 2021
Applicant:

United Microelectronics Corp., Hsin-Chu, TW;

Inventors:

Hsiao-Pang Chou, Taipei, TW;

Hon-Huei Liu, Kaohsiung, TW;

Ming-Chang Lu, Changhua County, TW;

Chin-Fu Lin, Tainan, TW;

Yu-Cheng Tung, Kaohsiung, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/04 (2006.01); H01L 29/20 (2006.01); H01L 21/02 (2006.01); H01L 29/06 (2006.01); H01L 21/308 (2006.01); H01L 21/306 (2006.01); H01L 23/00 (2006.01); H01L 33/00 (2010.01); H01L 33/12 (2010.01); H01L 33/16 (2010.01); H01L 29/165 (2006.01);
U.S. Cl.
CPC ...
H01L 29/2003 (2013.01); H01L 21/0243 (2013.01); H01L 21/0254 (2013.01); H01L 21/02381 (2013.01); H01L 21/02433 (2013.01); H01L 21/02458 (2013.01); H01L 21/02647 (2013.01); H01L 21/308 (2013.01); H01L 21/30604 (2013.01); H01L 23/562 (2013.01); H01L 29/04 (2013.01); H01L 29/045 (2013.01); H01L 29/0603 (2013.01); H01L 29/165 (2013.01); H01L 33/007 (2013.01); H01L 33/12 (2013.01); H01L 33/16 (2013.01);
Abstract

The present invention discloses a semiconductor structure with an epitaxial layer, including a substrate, a blocking layer on said substrate, wherein said blocking layer is provided with predetermined recess patterns, multiple recesses formed in said substrate, wherein each of said multiple recesses is in 3D diamond shape with a centerline perpendicular to a surface of said substrate, a buffer layer on a surface of each of said multiple recesses, and an epitaxial layer comprising a buried portion formed on said buffer layer in each of said multiple recesses and only one above-surface portion formed directly above said blocking layer and directly above said recess patterns of said blocking layer, and said above-surface portion directly connects said buried portion in each of said multiple recesses, and a first void is formed inside each of said buried portions of said epitaxial layer in said recess.


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