The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2022

Filed:

Jan. 24, 2017
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Christoph Husemann, Jena, DE;

Lars Stoppe, Jena, DE;

Tanja Teuber, Aalen, DE;

Lars Omlor, Aalen, DE;

Kai Wicker, Jena, DE;

Enrico Geissler, Jena, DE;

Senthil Kumar Lakshmanan, Erfurt, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); H04N 13/189 (2018.01); H04N 13/156 (2018.01); H04N 13/302 (2018.01); G02B 21/14 (2006.01); G02B 21/22 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 21/14 (2013.01); G02B 21/22 (2013.01); H04N 13/156 (2018.05); H04N 13/189 (2018.05); H04N 13/302 (2018.05);
Abstract

Various approaches in which an image-recording parameter is varied between a plurality of images of an object and a stereo image pair is displayed on the basis of the images recorded thus are described. Here, in particular, the image-recording parameter can be a focal plane or an illumination direction.


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