The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2022

Filed:

Sep. 05, 2018
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Shyh-Wei Cheng, Zhudong Township, TW;

Chih-Yu Wang, Taichung, TW;

Hsi-Cheng Hsu, Taichung, TW;

Ji-Hong Chiang, Changhua, TW;

Jui-Chun Weng, Taipei, TW;

Shiuan-Jeng Lin, Hsinchu, TW;

Wei-Ding Wu, Zhubei, TW;

Ching-Hsiang Hu, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B81B 7/00 (2006.01); B81C 1/00 (2006.01);
U.S. Cl.
CPC ...
B81B 7/007 (2013.01); B81B 7/0006 (2013.01); B81C 1/00238 (2013.01); B81C 1/00301 (2013.01); B81B 2207/012 (2013.01); B81B 2207/096 (2013.01); B81C 2201/013 (2013.01); B81C 2203/0109 (2013.01); B81C 2203/0118 (2013.01); B81C 2203/037 (2013.01); B81C 2203/0792 (2013.01);
Abstract

The present disclosure, in some embodiments, relates to a method of forming a micro-electromechanical system (MEMS) package. The method includes forming one or more depressions within a capping substrate. A back-side of a MEMS substrate is bonded to the capping substrate after forming the one or more depressions, so that the one or more depressions define one or more cavities between the capping substrate and the MEMS substrate. A front-side of the MEMS substrate is selectively etched to form one or more trenches extending through the MEMS substrate, and one or more polysilicon vias are formed within the one or more trenches. A conductive bonding structure is formed on the front-side of the MEMS substrate at a location contacting the one or more polysilicon vias. The MEMS substrate is bonded to a CMOS substrate having one or more semiconductor devices by way of the conductive bonding structure.


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