The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Dec. 18, 2020
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Renato C. Padilla, Folsom, CA (US);

Sampath K. Ratnam, Boise, ID (US);

Christopher M. Smitchger, Garden City, ID (US);

Vamsi Pavan Rayaprolu, San Jose, CA (US);

Gary F. Besinga, Boise, ID (US);

Michael G. Miller, Boise, ID (US);

Tawalin Opastrakoon, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/10 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G11C 29/10 (2013.01); G06F 11/076 (2013.01); G06F 11/0736 (2013.01); G06F 11/0757 (2013.01);
Abstract

In one embodiment, a system maintains metadata associating each block of a plurality of blocks of the memory device with a corresponding frequency access group, where each frequency access group is associated with a corresponding scan frequency. The system determines that a first predetermined time period has elapsed since a last scan operation performed with respect to one or more blocks of the memory device, where the first predetermined time period specifies a first scan frequency. The system selects, based on the metadata, at least one block from a first frequency access group associated with the first scan frequency. The system performs a scan operation with respect to the selected block.


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