Circuit and method for at speed detection of a word line fault condition in a memory circuit

Abstract

First and second memory arrays have common word lines driven by a row decoder in response to a row address. A first word line encoder associated with the first memory array encodes signals on the word lines to generate a first encoded value, and a second word line encoder associated with the second memory array encodes signals on the word lines to generate a second encoded value. Comparison circuitry compares the first encoded value to a first expected value (e.g., a first portion of the row address) and compares the second encoded value to a second expected value (e.g., a second portion of the row address). An error flag is asserted to indicate presence of a word line fault based upon a lack of match between the first encoded value and the first expected value and/or a lack of match between the second encoded value and the second expected value.