The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 12, 2022

Filed:

May. 18, 2017
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Sang-Ho Yu, Cupertino, CA (US);

Kevin Moraes, Fremont, CA (US);

Seshadri Ganguli, Sunnyvale, CA (US);

Hua Chung, San Jose, CA (US);

See-Eng Phan, San Jose, CA (US);

Assignee:

APPLIED MATERIALS, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/16 (2006.01); H01L 21/324 (2006.01); H01L 21/768 (2006.01); C23C 16/02 (2006.01); C23C 16/18 (2006.01); H01L 21/02 (2006.01); H01L 21/285 (2006.01); C23C 16/455 (2006.01); C23C 16/50 (2006.01);
U.S. Cl.
CPC ...
C23C 16/16 (2013.01); C23C 16/0218 (2013.01); C23C 16/0245 (2013.01); C23C 16/18 (2013.01); C23C 16/4554 (2013.01); C23C 16/45542 (2013.01); C23C 16/50 (2013.01); H01L 21/02068 (2013.01); H01L 21/02074 (2013.01); H01L 21/2855 (2013.01); H01L 21/28556 (2013.01); H01L 21/28562 (2013.01); H01L 21/324 (2013.01); H01L 21/7685 (2013.01); H01L 21/76849 (2013.01); H01L 21/76862 (2013.01); H01L 21/76883 (2013.01);
Abstract

Embodiments of the invention provide processes to selectively form a cobalt layer on a copper surface over exposed dielectric surfaces. In one embodiment, a method for capping a copper surface on a substrate is provided which includes positioning a substrate within a processing chamber, wherein the substrate contains a contaminated copper surface and a dielectric surface, exposing the contaminated copper surface to a reducing agent while forming a copper surface during a pre-treatment process, exposing the substrate to a cobalt precursor gas to selectively form a cobalt capping layer over the copper surface while leaving exposed the dielectric surface during a vapor deposition process, and depositing a dielectric barrier layer over the cobalt capping layer and the dielectric surface. In another embodiment, a deposition-treatment cycle includes performing the vapor deposition process and subsequently a post-treatment process, which deposition-treatment cycle may be repeated to form multiple cobalt capping layers.


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