The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Jan. 27, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Gerald L. Cadloni, Longmont, CO (US);

Mark Ish, San Ramon, CA (US);

James P. Crowley, Longmont, CO (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G06F 11/10 (2006.01); G06F 11/07 (2006.01); G06F 12/02 (2006.01); G06F 12/0882 (2016.01); G06F 12/1081 (2016.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G06F 11/076 (2013.01); G06F 11/0772 (2013.01); G06F 11/3037 (2013.01); G06F 12/0246 (2013.01); G06F 12/0882 (2013.01); G06F 12/1081 (2013.01); G06F 2212/7201 (2013.01);
Abstract

A total read counter, a plurality of die read counters, and a plurality of block read counters are maintained. Each die read counter is associated with a respective die of a memory device. A value of a block read counter and a value of a die read counter are determined for a specified block. Based on the value of the block read counter, the value of the die read counter, and the value of the total read counter, an estimated number of read events associated with the specified block of the memory device is determined. Responsive to determining that the estimated number of read events satisfies a predefined criterion, a media management operation of one or more pages associated with the specified block is performed.


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