The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 05, 2022

Filed:

Aug. 03, 2020
Applicant:

Origin Laboratories, Inc., San Francisco, CA (US);

Inventors:

Joel Ong, San Francisco, CA (US);

Christopher Prucha, San Francisco, CA (US);

Assignee:

Stratasys, Inc., Eden Prairie, MN (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29C 64/393 (2017.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B29C 64/124 (2017.01); B33Y 10/00 (2015.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); B29C 64/124 (2017.08); B33Y 10/00 (2014.12);
Abstract

An additive manufacturing system configured to: during a first build cycle of an additive manufacturing process for manufacturing a first layer of a build, sampling a first set of sensor data streams via the sensor suite; calculate a first likelihood of failure of the build based on the first set of sensor data streams; in response to calculating the first likelihood of failure within a first likelihood range, flag the build to indicate the first likelihood of failure; and in response to calculating the first likelihood of failure within a second likelihood range greater than the first likelihood range, pause the additive manufacturing process, and notify an operator of the additive manufacturing system of the first likelihood of failure.


Find Patent Forward Citations

Loading…