The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2022
Filed:
Jun. 04, 2021
Synopsys, Inc., Mountain View, CA (US);
Mayukh Bhattacharya, Palo Alto, CA (US);
Mihir Sherlekar, Mountain View, CA (US);
Antony Fan, Mountain View, CA (US);
Synopsys, Inc., Mountain View, CA (US);
Abstract
A method of evaluating sampling sizes for circuit simulation comprises generating a plurality of coverage scenarios based on a defect universe, determining a coverage amount for each of the plurality of coverage scenarios, and associating the plurality of coverage scenarios with a plurality of bins based on the coverage amount for each of the plurality of coverage scenarios. The method further comprises sampling, with a first sampling size, each of the coverage scenarios to determine first sampled coverage scenarios, and determining an error value for each of the plurality of coverage scenarios based on the coverage amount of each of the plurality of coverage scenarios and a coverage amount of a respective one of the first sampled coverage scenarios. Further, the method comprises generating, with a processor and for the first sampling size, a confidence score for each of the plurality of bins based on the error value for each of the plurality of coverage scenarios, and outputting the confidence score for each of the plurality of bins.