The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2022

Filed:

Feb. 02, 2021
Applicant:

Changxin Memory Technologies, Inc., Anhui, CN;

Inventor:

Cheng-Jer Yang, Hefei, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G11C 7/22 (2006.01); G01R 31/317 (2006.01); G11C 29/12 (2006.01); G11C 7/10 (2006.01); G01R 31/28 (2006.01); G01R 29/18 (2006.01); G01R 31/3187 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 29/18 (2013.01); G01R 31/2841 (2013.01); G01R 31/317 (2013.01); G01R 31/3187 (2013.01); G01R 31/31727 (2013.01); G11C 7/1078 (2013.01); G11C 7/1087 (2013.01); G11C 7/222 (2013.01); G11C 7/225 (2013.01); G11C 29/1201 (2013.01); G11C 29/12015 (2013.01);
Abstract

Boundary test circuit, memory and boundary test method are provided. The boundary test circuit may include a plurality of serially-connected wrapper boundary registers (WBRs) and a plurality of toggle circuits (TCs). Each WBR may include a first I/O for receiving an initial test signal and a second I/O for transmitting the initial test signal to the WBR at a succeeding stage. Each TC may include an input for receiving the initial test signal stored in a corresponding WBR, a control I/O for receiving a toggle signal, and an output for transmitting a real-time test signal to the integrated circuit. The toggle signal may be configured to control phase switching of the real-time test signal, and, depending on the toggle signal, the real-time test signal may have a phase identical or inverse to a phase of the initial test signal. This method improves the efficiency and flexibility of the boundary test.


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