The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 17, 2022

Filed:

Jan. 02, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Chun-Chen Yeh, Danbury, CT (US);

Ruilong Xie, Niskayuna, NY (US);

Alexander Reznicek, Troy, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 27/088 (2006.01); H01L 29/08 (2006.01); H01L 29/10 (2006.01); H01L 29/06 (2006.01); H01L 29/66 (2006.01); H01L 21/762 (2006.01); H01L 21/3065 (2006.01); H01L 21/8234 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7827 (2013.01); H01L 21/02532 (2013.01); H01L 21/3065 (2013.01); H01L 21/76224 (2013.01); H01L 21/823412 (2013.01); H01L 21/823418 (2013.01); H01L 21/823481 (2013.01); H01L 21/823487 (2013.01); H01L 27/088 (2013.01); H01L 29/0692 (2013.01); H01L 29/0847 (2013.01); H01L 29/1037 (2013.01); H01L 29/66666 (2013.01);
Abstract

A method of forming a semiconductor device includes forming a sacrificial epitaxial layer upon a substrate, forming a stack of semiconductor material layers upon the sacrificial epitaxial layer, forming fin mandrels for vertical transistors, selectively etching the sacrificial epitaxial layer beneath the fin mandrels, forming source-drain regions beneath the fin mandrels, selectively removing portions of the fin mandrels creating the fins, and forming source-drain contacts electrically connected to the source-drain regions.


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