The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2022

Filed:

Sep. 04, 2020
Applicant:

Ansys, Inc., Canonsburg, PA (US);

Inventors:

Lang Lin, Cupertino, CA (US);

Dinesh Kumar Selvakumaran, Pflugerville, TX (US);

Norman Chang, Fremont, CA (US);

Calvin Chow, Redwood City, CA (US);

Deqi Zhu, San Jose, CA (US);

Assignee:

ANSYS, INC., Canonsburg, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/347 (2020.01); G06F 119/02 (2020.01); G06F 119/06 (2020.01); G06F 119/10 (2020.01); G06F 21/72 (2013.01); G06F 21/75 (2013.01); G06F 113/18 (2020.01); G06F 115/08 (2020.01);
U.S. Cl.
CPC ...
G06F 30/347 (2020.01); G06F 21/72 (2013.01); G06F 21/755 (2017.08); G06F 2113/18 (2020.01); G06F 2115/08 (2020.01); G06F 2119/02 (2020.01); G06F 2119/06 (2020.01); G06F 2119/10 (2020.01);
Abstract

Methods, machine readable media and systems for simulating the leakage of sensitive data in an integrated circuit, such as cryptographic data or keys, are described. In one embodiment, a method can include the following operations: performing a first dynamic voltage drop (DVD) simulation on a plurality of locations, distributed across an integrated circuit (IC), based on a physical model that specifies physical layout of components on the IC, the IC storing sensitive data in locations of the layout; performing an IC level side channel correlation analysis between each of the locations and the sensitive data based on the results of the first DVD simulation; and selecting, based upon the IC level side channel correlation analysis, a subset of the locations for further simulations to simulate leakage of the sensitive data. Other methods, media and systems are disclosed.


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