The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

Dec. 20, 2019
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Aswin Thiruvengadam, Folsom, CA (US);

Daniel L. Lowrance, El Dorado Hills, CA (US);

Joshua Phelps, Boise, ID (US);

Peter B. Harrington, Sunnyvale, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G06N 3/08 (2006.01); G06F 11/22 (2006.01); G06N 3/04 (2006.01); G06F 11/00 (2006.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 11/008 (2013.01); G06F 11/2257 (2013.01); G06F 11/2263 (2013.01); G06N 3/04 (2013.01); G11C 29/50 (2013.01); G11C 2029/5004 (2013.01);
Abstract

Disclosed is a system comprising a memory component having a plurality of memory cells capable of being in a plurality of states, each state of the plurality of states corresponding to a value stored by the memory cell, and a processing device, operatively coupled with the memory component, to perform operations comprising: obtaining, for the plurality of memory cells, a plurality of distributions of threshold voltages, wherein each of the plurality of distributions corresponds to one of the plurality of states, classifying each of the plurality of distributions among one of a plurality of classes, generating a vector comprising a plurality of components, wherein each of the plurality of components represents the class of a respective one of the plurality of distributions, and processing, using a classifier, the generated vector to determine a likelihood that the memory component will fail within a target period of time.


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