The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

May. 16, 2017
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Eng Huat Goh, Ayer Itam, MY;

Jiun Hann Sir, Gelugor, MY;

Min Suet Lim, Bayan Lepas, MY;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/498 (2006.01); H01L 23/31 (2006.01); H01L 23/50 (2006.01); H01L 23/00 (2006.01); H01L 21/48 (2006.01);
U.S. Cl.
CPC ...
H01L 23/49838 (2013.01); H01L 23/31 (2013.01); H01L 23/49866 (2013.01); H01L 23/50 (2013.01); H01L 21/4853 (2013.01); H01L 23/49816 (2013.01); H01L 24/16 (2013.01); H01L 24/81 (2013.01); H01L 2224/131 (2013.01); H01L 2224/16237 (2013.01); H01L 2224/16238 (2013.01); H01L 2224/81193 (2013.01); H01L 2224/81447 (2013.01); H01L 2224/81455 (2013.01);
Abstract

In accordance with disclosed embodiments, there are provided systems, methods, and apparatuses for implementing a Pad on Solder Mask (PoSM) semiconductor substrate package. For instance, in accordance with one embodiment, there is a substrate package having embodied therein a functional silicon die at a top layer of the substrate package; a solder resist layer beneath the functional silicon die of the substrate package; a plurality of die bumps at a bottom surface of the functional silicon die, the plurality of die bumps electrically interfacing the functional silicon die to a substrate through a plurality of solder balls at a top surface of the solder resist layer; each of the plurality of die bumps electrically interfaced to a nickel pad at least partially within the solder resist layer and beneath the solder balls; each of the plurality of die bumps electrically interfaced through the nickel pads to a conductive pad exposed at a bottom surface of the solder resist layer; and in which each of the conductive pads exposed at the bottom surface of the solder resist layer are electrically interfaced to an electrical trace at the substrate of the substrate package. Other related embodiments are disclosed.


Find Patent Forward Citations

Loading…