The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2022

Filed:

Oct. 30, 2020
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventors:

Emil I. Gizdarski, Cupertino, CA (US);

Fadi Maamari, San Jose, CA (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/333 (2020.01); G01R 31/3183 (2006.01); G01R 31/3185 (2006.01); G06F 117/02 (2020.01);
U.S. Cl.
CPC ...
G06F 30/333 (2020.01); G01R 31/31835 (2013.01); G01R 31/318566 (2013.01); G01R 31/318307 (2013.01); G06F 2117/02 (2020.01);
Abstract

An integrated circuit (IC) design comprising a scan chain may be received, where stimulus values may be scanned-in and response values may be scanned-out through a scan path in the scan chain, where the scan path may include a first scan cell and a second scan cell such that the first scan cell is downstream with respect to the second scan cell. The scan chain may be modified to enable observation of a 0 and a 1 value in the first scan cell in presence of a defect in the second scan cell, or observation of a 0 and a 1 value in the second scan cell in presence of a defect in the first scan cell.


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