The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2022
Filed:
Dec. 22, 2020
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Jason M. Johnson, Nampa, ID (US);
Jung-Hwa Choi, Boise, ID (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/10 (2006.01); G11C 11/4076 (2006.01); G11C 11/4093 (2006.01); G11C 7/22 (2006.01); G11C 11/408 (2006.01);
U.S. Cl.
CPC ...
G11C 7/222 (2013.01); G11C 7/109 (2013.01); G11C 7/1063 (2013.01); G11C 11/4076 (2013.01); G11C 11/4087 (2013.01); G11C 2207/105 (2013.01); G11C 2207/2254 (2013.01);
Abstract
An apparatus includes: a master die; one or more slave dies; a ZQ resister between a first node and a second node coupled to a voltage terminal; a ZQ pad coupled to each of the first node of the ZQ resister, the master die and the one or more slave dies; and a calibration channel electrically coupling the master die and the one or more slave dies, the calibration channel configured to communicate signals between the master die and the one or more slave dies for coordinating access to the ZQ pad across the master die and the one or more slave dies.