The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2022

Filed:

Jun. 30, 2020
Applicants:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Tsmc Nanjing Company Limited, Nanjing, CN;

Inventors:

Yi-Lin Chuang, Taipei, TW;

Shi-Wen Tan, Nanjing, CN;

Szu-Ju Huang, Hsinchu County, TW;

Shih-Feng Hong, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/31 (2020.01); G06F 111/04 (2020.01); G06F 111/06 (2020.01);
U.S. Cl.
CPC ...
G06F 30/31 (2020.01); G06F 2111/04 (2020.01); G06F 2111/06 (2020.01);
Abstract

A method, for determining constraints related to a target circuit, includes following operations. First circuit speed results of the target circuit under different candidate constraint configurations are accumulated. Breakthrough probability distributions relative to each of the candidate constraint configurations are determined according to the first circuit speed results. First selected constraint configurations are determined from the candidate constraint configurations by sampling the breakthrough probability distributions. A first budget distribution is determined among the first selected constraint configurations. In response to that the first budget distribution is converged, the first selected constraint configurations in the first budget distribution is utilized for implementing the target circuit and generating an updated circuit speed result of the target circuit.


Find Patent Forward Citations

Chuang, Yi-Lin. (2022). Constraint determination system and method for semiconductor circuit (U.S. Patent No. 11263375). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11263375

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…