The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 11, 2022

Filed:

Mar. 23, 2020
Applicant:

Jeol Ltd., Tokyo, JP;

Inventors:

Kazuya Yamazaki, Tokyo, JP;

Yuko Shimizu, Tokyo, JP;

Hirofumi Iijima, Tokyo, JP;

Takuma Fukumura, Tokyo, JP;

Naoki Hosogi, Tokyo, JP;

Tomohiro Nakamichi, Tokyo, JP;

Assignee:

JEOL Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/10 (2006.01); H01J 37/147 (2006.01); H01J 37/26 (2006.01);
U.S. Cl.
CPC ...
H01J 37/10 (2013.01); H01J 37/147 (2013.01); H01J 37/26 (2013.01);
Abstract

A charged particle beam device includes: a charged particle source; an optical system which acts on a charged particle beam emitted from the charged particle source; a control unit which controls the optical system; and a storage unit which stores previous setting values of the optical system. The optical system includes a first optical element and a second optical element for controlling a state of the charged particle beam to be incident on the first optical element. The control unit obtains an initial value of a setting value of the second optical element based on previous setting values of the second optical element; and changes a state of the charged particle beam by changing the setting value of the second optical element from the obtained initial value and obtains the setting value of the second optical element based on the change in the state of the charged particle beam.


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