The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 2021

Filed:

Apr. 21, 2021
Applicant:

Realtek Semiconductor Corporation, Hsinchu, TW;

Inventors:

I-Hsiu Lo, Hsinchu, TW;

Yung-Jen Chen, Hsinchu, TW;

Yu-Lan Lo, Hsinchu, TW;

Shu-Yi Kao, Hsinchu, TW;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/3312 (2020.01); G06F 30/333 (2020.01); G06F 30/3323 (2020.01); G06F 30/373 (2020.01); G06F 30/398 (2020.01); H03L 7/095 (2006.01);
U.S. Cl.
CPC ...
G06F 30/3312 (2020.01); G06F 30/333 (2020.01); H03L 7/095 (2013.01); G06F 30/3323 (2020.01); G06F 30/373 (2020.01); G06F 30/398 (2020.01);
Abstract

A clock deadlock detecting system includes a memory and a processor. The memory is configured to store at least one computer program. The processor is configured to execute the at least one computer program to perform following operations: extracting hierarchy information of a plurality of integrated clock gating (ICG) cells, in which the hierarchy information is a description of a circuit structure of the ICG cells; generating at least one checking property according to integrated circuit design information and the hierarchy information; determining whether the ICG cells satisfy the at least one checking property according to the integrated circuit design information and a formal method to determine whether the ICG cells is expected to fall into at least one clock deadlock state, so as to generate a determination result; and modifying the integrated circuit design information according to the determination result.


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