The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 30, 2021

Filed:

Mar. 06, 2020
Applicant:

Inpria Corporation, Corvallis, OR (US);

Inventors:

Mollie Waller, Corvallis, OR (US);

Brian J. Cardineau, Corvallis, OR (US);

Kai Jiang, Corvallis, OR (US);

Alan J. Telecky, Albany, OR (US);

Stephen T. Meyers, Corvallis, OR (US);

Benjamin L. Clark, Corvallis, OR (US);

Assignee:

Inpria Corporation, Corvallis, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/027 (2006.01); H01L 21/67 (2006.01); G03F 7/42 (2006.01); G03F 7/16 (2006.01); G03F 7/004 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
G03F 7/422 (2013.01); G03F 7/0042 (2013.01); G03F 7/162 (2013.01); G03F 7/168 (2013.01); H01L 21/0273 (2013.01); H01L 21/02087 (2013.01); H01L 21/67051 (2013.01);
Abstract

Apparatuses and methods are described for removing edge bead on a wafer associated with a resist coating comprising a metal containing resist compositions. The methods can comprise applying a first bead edge rinse solution along a wafer edge following spin coating of the wafer with the metal based resist composition, wherein the edge bead solution comprises an organic solvent and an additive comprising a carboxylic acid, an inorganic fluorinated acid, a tetraalkylammonium compound, or a mixture thereof. Alternatively or additionally, the methods can comprise applying a protective composition to the wafer prior to performing an edge bead rinse. The protective composition can be a sacrificial material or an anti-adhesion material and can be applied only to the wafer edge or across the entire wafer in the case of the protective composition. Corresponding apparatuses for processing the wafers using these methods are presented.


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