The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

Oct. 24, 2019
Applicant:

Marvell International Ltd., Hamilton, BM;

Inventors:

Manish Nayini, Wappingers Falls, NY (US);

Richard S. Graf, Gray, ME (US);

Janak G. Patel, South Burlington, VT (US);

Nazmul Habib, Colchester, VT (US);

Assignee:

MARVELL ASIA PTE, LTD., Singapore, SG;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 29/40 (2006.01); H01L 23/00 (2006.01); H01L 23/498 (2006.01); H01L 21/48 (2006.01); H01L 21/56 (2006.01); B23K 1/00 (2006.01); H01L 23/31 (2006.01); B23K 101/40 (2006.01);
U.S. Cl.
CPC ...
H01L 24/14 (2013.01); B23K 1/0008 (2013.01); H01L 21/4853 (2013.01); H01L 21/563 (2013.01); H01L 23/3157 (2013.01); H01L 23/49805 (2013.01); H01L 23/49816 (2013.01); H01L 23/49838 (2013.01); H01L 24/13 (2013.01); H01L 24/16 (2013.01); H01L 24/81 (2013.01); B23K 2101/40 (2018.08); H01L 2224/13211 (2013.01); H01L 2224/13239 (2013.01); H01L 2224/13247 (2013.01); H01L 2224/1403 (2013.01); H01L 2224/14517 (2013.01); H01L 2224/16227 (2013.01); H01L 2224/81125 (2013.01); H01L 2224/81815 (2013.01); H01L 2924/014 (2013.01); H01L 2924/0105 (2013.01); H01L 2924/01029 (2013.01); H01L 2924/01047 (2013.01); H01L 2924/15321 (2013.01); H01L 2924/18161 (2013.01); H01L 2924/35121 (2013.01);
Abstract

An IC chip package includes a substrate having a plurality of interconnect metal pads, and a chip having a plurality of interconnect metal pads arranged thereon. An interconnect solder structure electrically connects each of the plurality of interconnect metal pads. The chip is devoid of the interconnect solder structures and interconnect metal pads at one or more corners of the chip. Rather, a dummy solder structure connects the IC chip to the substrate at each of the one or more corners of the IC chip, and the dummy solder structure is directly under at least one side of the IC chip at the one or more corners of the IC chip. The dummy solder structure has a larger volume than a volume of each of the plurality of interconnect solder structures. The dummy solder structure eliminates a chip-underfill interface at corner(s) of the chip where delamination would occur.


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