The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

Apr. 26, 2019
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Kandabara Tapily, Albany, NY (US);

Gerrit Leusink, Albany, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 21/768 (2006.01); H01L 21/285 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02263 (2013.01); H01L 21/0228 (2013.01); H01L 21/02164 (2013.01); H01L 21/02172 (2013.01); H01L 21/02186 (2013.01); H01L 21/02214 (2013.01); H01L 21/02304 (2013.01); H01L 21/02312 (2013.01); H01L 21/28562 (2013.01); H01L 21/76834 (2013.01); H01L 21/76849 (2013.01); H01L 21/76888 (2013.01);
Abstract

A method of area selective deposition for cap layer formation in advanced semiconductor contacts. The method includes providing a planarized substrate including a first dielectric layer and a first metal layer, oxidizing a surface of the first metal layer to form an oxidized metal layer, and selectively depositing a second dielectric layer on the oxidized metal layer. The selectively depositing the second dielectric layer can include moving the planarized substrate below a gas inlet dispensing a deposition gas during a spatial vapor phase deposition process, where the deposition gas is preferentially exposed to the oxidized metal layer extending above a surface of the first dielectric layer.


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