The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2021

Filed:

Jun. 18, 2019
Applicant:

Nxp Usa, Inc., Austin, TX (US);

Inventors:

Nihaar N. Mahatme, Austin, TX (US);

Srikanth Jagannathan, Austin, TX (US);

Assignee:

NXP USA, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/02 (2006.01); G01R 31/3193 (2006.01); G11C 7/10 (2006.01);
U.S. Cl.
CPC ...
G11C 29/02 (2013.01); G01R 31/31937 (2013.01); G11C 7/1063 (2013.01);
Abstract

A circuit includes a glitch measurement circuit and a glitch profile circuit. The glitch measurement circuit includes a first comparator to compare a glitch in a power supply voltage to a first threshold voltage, a first counter to generate a first count indicative of a time duration the first comparator indicates that the glitch trips the first threshold voltage, a second comparator to compare the glitch in the power supply voltage to a second threshold voltage different than the first threshold voltage, and a second counter to generate a second count indicative of a time duration the second comparator indicates that the glitch trips the second threshold voltage. The glitch profile circuitry utilizes the first count and the second count to generate a multi-voltage profile of the glitch, wherein the multi-voltage profile includes indications of the time durations indicated by the first count and the second count.


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